Instrumentation and USIC

About

Department of Instrumentation & USIC started as University Science Instrumentation Centre (USIC) in 1978 under USIC scheme of University Grants Commission (UGC) in the department of Physics, GU. It became a full-fledged department in 1986. The main building of the department was constructed with grants from UGC and was inaugurated by the then Hon-ble Chancellor of GU Sri Bhisma Narayan Singh on 13th August 1988. The department was recognized as an academic department in 1987 by the Academic Council, GU.

The Post Graduate Diploma in Instrumentation (PGDI) course was started in 1987-88 and was the first such course in the entire NE region which trained qualified engineers and scientists to gain experience in the field of instrumentation. Seventy Five (75) students have passed out PGDI and many of the PGDI passed students are employed in the industries like Oil India Limited (OIL), Gauhati Refinery, Numiligar Refinery etc.

The department through it's repair and maintenance wing has been rendering services in the field of operation, repair and maintenance of various instruments not only to the departments of this university but also to affiliated colleges and other public and private organizations of the NE region. The center has also successfully completed a number of training programs on repair and maintenance of scientific equipment, glass blowing and use of mechanical workshop equipment. A large number of jobs have been done by the repair and maintenance wing of the department and there by has saved considerable amount of GU exchequer. A considerable amount has been earned from outside institutions by rendering repair and maintenance services. Some of the outside institutions that have availed of repair and maintenance services of the department in past are Handique Girls College, B Barooah College, Forensic Science Lab, Assam and Meghalaya, NERIST, Royal Bhutan Polytechnic, Sherbutse College, Bhutan, Statefed Tripti Vanaspati Plant, Gauhati Medical College & Hospital, Assam Engineering College, Indian Institute of Technology, Guwahati etc.

The department has been rendering training to persons deputed from outside institutions from time to time. Trainees deputed from NEHU & IASST were trained in the department and revenue has been earned through such training. The department has organized workshops, seminars etc. from time to time. A two weeks training Programme in Electronics and Instrumentation was organized in 1988-89. Another workshop on Repair and Maintenance of Laboratory instruments for college teachers was organized in 1992. The department hosted the National Symposium on Instrumentation ( NSI-17) in 1992.

At present the practical classes of Workshop Practice of GUIST and MSc Instrumentation are conducted in the workshop of the department.

Sophisticated Analytical Instrument Facility (SAIF), sponsored by Department of Science and Technology, Govt of India was established in 1986 as a Regional X-ray Facility in the department to cater the need of scientific community from research, academic and industrial organizations. SAIF is rendering analytical services in the field of X-ray Diffractometry (XRD), X-ray Fluoroscence Spectrometry (XRF) and Single Crystal X-ray Diffractometry. SAIF has been regularly participating in the rounds of International Proficiency Test for Analytical Geochemical Laboratories conducted by International Association of Geoanalysts (IAG) and has so far organized six workshops on Theory and Practices of XRD, XRF and SCXRD.

The name of the department was changed to Department of Instrumentation & USIC in 2005 and MSc in Instrumentation course was introduced with effect from 2004-2005.

Chronology

  • Year of Establishment : 1978
  • Inauguration of Building : 13th August 1988
  • Establishment of SAIF : 1986
  • Recognition as Academic Department : 1987
  • Introduction of PGDI Course : 1987-88
  • Introduction of MSc Instrumentation Course : 2004-05
  • First PhD Produced : 1994

Head of the Department

  • Prof I M Das , Founder Head ( 1978 - 1995)
  • Prof G K D Mazumdar( 1995 - 1998)
  • Prof P K Baruah( 1998 - 1999)
  • Prof G K D Mazumdar( 1999 - 2005)
  • Prof P K Boruah (2005 - 2007)
  • Prof K C Sarma (2007 - till date )

Old Departmental Data

Two-Year Four Semester MSc Course in Instrumentation has been introduced since 2005. Earlier a One Year Two Semesters Post Graduate Diploma in Instrumentation (PGDI) course introduced in 1987-88 was conducted.

Research

Inter-departmental interdisciplinary research programmes are undertaken by the faculty members of the department.

Some of our activities are:
(a) Research in various fields of instrumentation.
(b) Generation of skilled manpower in instrumentation
(c) Design and fabrication of instrument required for teaching and research.
(d) To nurture and spread the culture of modern instrumentation
(e) To provide services in repair and maintenance of instrument
(f) To provide analytical services through SAIF.

Postgraduate Course

Course Type: Course Name: Subject: Semesters Years Intake Capacity:
Postgraduate MSc in Instrumentation Instrumentation 4 2 20
Course Type: Course Name: Subject: Semesters Years Intake Capacity:
Postgraduate PhD in Instrumentation Instrumentation 3-5 56

Professors

Kanak Chandra Sarma [ Head of the Department ]
MSc (Gauhati) PhD (Gauhati) Electronics
kanaksarma64@gauhati.ac.in
Pran Hari Talukdar
MSc (Gauhati) PhD (Gauhati) Electronics
phtassam@gauhati.ac.in

Associate Professor

Utpal Sarma
MSc (Gauhati) PhD (Gauhati) Electronics
utpalsarma@gauhati.ac.in

Associated Faculty

Dayananda Goswami
MSc (Gauhati) (Guest Faculty)
dayananda_g@gauhati.ac.in
Pradip Kumar Boruah (Retired Professor)
MSc (Gauhati) PhD (Gauhati) Electronics (Guest Faculty)
Sanjib Karmakar (Nano Technology) Scientific Officer
Santanu Bardaloi (Nano Technology) Jr Scientific Officer
Dipak Das (Image Processing) Technical Officer
Bijoy Shankar Kalita, Jr Technical Officer
B N Rajbongshi, Jr Technical Officer
Akalpita Das (Speech Processing)
Anindita Bora
Anirudha Gogoi
Anup Kumar Kalita (Nano Technology)
Apurba Kr. Buzarbaruah (Nano Technology)
Archana Das (Nano Technology)
Babak Montezar (MEMS based energy harvester)
Bandita Dihingia
Bhaskar Jyoti Baruah
Bitopi Sarma (Speech Processing)
Chandralika Chakraborty (Speech Processing)
Chitra Gautam (Instrumentation for Food Storage)
Dayananda Goswami DST- INSPIRE Fellow
Debashis Saikia (Instrumentation for Tea Process Parameter) DST-INSPIRE Fellow
Dhaneswar Kalita (Nano Technology)
Dipak Ch. Deka (Nano Technology)
Dulal Ch. Das (Speech Processing)
Gajendra Nath Sarma (Nano Technology)
Gautam Bortamuli (Nano Technology)
Hemanta Saikia
Hiten Sarma (Nano Technology)
Jayanta Nath
Jitumoni Mudoi (Nano Technology)
Kesho Sing (Nano Technology)
Kibriya Siddique (Nano Technology)
Kunja Lata Kalita (Instrumentation for detection of Physical Changes of Wood )
Laba Kumar Thakuria (Speech Processing)
Manash Pratim Goswami (Instrumentation for Horticulture) DST-INSPIRE Fellow
Motiur Rahman (Nano Technology)
Mousmita Devi (Speech Processing)
Mrinal Kanti Debanath (Nano Technology)
Nipan Das (Instrumentation for Tea Process Parameter)
Paragmoni Baruah (Nano Technology)
Prinche Mochahri (Nano Technology) UGC Teacher Fellow
PritishaDakuwa (Nano Technology)
Rajdeep Choudhury (Instrumentation for VOC detection) DST-INSPIRE Fellow
Rita Choudhury (Nano Technology)
Sharmila Nath
Subrata Das (Speech Processing)
Sudipta Hazarika (Instrumentation for VOC detection) DST-INSPIRE Fellow
ThIbotombi Singh (Nano Technology)
Mathan Chandra Deka (Technician-D : Glass Blowing)
SurathKalita (Technician-D : Electronics)
UttamPathak (Technician-D : Electrical)
Ghana KantaSaikia (Technician-B : Welding)
Karuna Choudhury (Technician-A : Mechanical)
Jagajit Hazarika (Store Keeper)
Nagen Chandra Kalita (XRD Attendant)
Mahesh Chandra Das (Laboratory Bearer)
Dipak Barman (Peon)
Narayan Das (Peon)

Contact

Department of Instrumentation and USIC
Gauhati University, Guwahati 781014, Assam
Phone : (+91) 9954048634
Email : iusic@gauhati.ac.in
Web   : gauhati.ac.in/iusic

Facilities

USIC

The USIC consists of one Mechanical Workshop having Carpentry Shop, Machine Shop, Welding Shop and Glass Blowing Shop, Electrical and Electronic Repair Shop. In these facilities, practical classes of Workshop Practice of MSc Instrumentation, Workshop Practice of Third Semester BTech/BS of GUIST are conducted.

SAIF

The Sophisticated Analytical Instrument Facility (SAIF) is a central facility of the university, sponsored by the Department of Science and Technology (DST), Govt of India and was set up at Department of Instrumentation and USIC, Gauhati University in 1986 at the beginning of the Seventh Plan as a National X-ray Facility with a view to extending moderns sophisticated analytical facility to scientific community and to cultivate instrumentation culture.

For details about SAIF please visit the link http://gauhati.ac.in/saif

Activity

Outreach Programme

The department organises Science Motivation Camp for school students every year.

Workshop

We organise :

  1. Hands on workshop in microcontroller and Embedded System for Teachers and Researchers.
  2. National and Regional workshops on XRD, XRF, SCXRD are organised every year.
  3. Hands on workshop for undergraduate students are also organised every year on system development using microcontroller

Friday Seminars

Seminars are held regularly on every Friday


Sophisticated Analytical Instrument Facility (SAIF), Guwahati
(Sponsored by Dept. of Science & Technology, Govt. of India)

History and Introduction

Sophisticated Analytical Instrument Facility ( SAIF ), Guwahati, sponsored by the Department of Science and Technology ( DST ), Govt. of India was set up at Department of Instrumentation and USIC, Gauhati University in 1986 at the beginning of the Seventh Plan as a National X-ray Facility with a view to extending moderns sophisticated analytical facility to scientific community and to cultivate instrumentation culture. At the time of establishment the facility was known as Sophisticated Instrument Facility ( SIF ) and Department of Instrumentation & USIC, Gauhati University was known as University Science Instrumentation Centre ( USIC ), Gauhati University.

Sophisticated Analytical Instrument Facility ( SAIF ) is a programme initiated by Department of Science & Technology, Govt. of India to provide facilities of sophisticated analytical instruments to researchers so that the non-availability of these instruments in their institutes may not come in the way of scientists in pursuing R&D activities requiring such facilities and researchers are able to keep pace with developments taking place globally. Thirteen Sophisticated Analytical Instrument Facilities (SAIFs) which provide sophisticated analytical instruments to users are functioning in various locations in the country and SAIF, Guwahati, located at Department of Instrumentation & USIC, Gauhati University is one of them.

SAIF, Guwahati is a facility comprised of sophisticated X-ray machines. It is open to all kinds of users from all over the country. Basic aim of SAIF is to cater the need of scientific community from research, academic and industrial organization.

The facility is at present is equipped with an X’pert Pro Automated Powder X-ray Diffractometer, Two Sequential X-ray Fluorescence Spectrometers with related accessories and sample preparation equipment.

Sophisticated Analytical Instrument Facility (SAIF), Guwahati
(Sponsored by Dept. of Science & Technology, Govt. of India)

Mission and Objectives

Missions and objectives of Sophisticated Analytical Instrument Facility ( SAIF ), Guwahati are:

  • To provide analytical services
  • To assist and support researchers in keeping pace with research and development taking place globally
  • To carry out analysis of samples received from the scientists/institutes
  • To provide facilities of sophisticated analytical instruments to scientists and other users from academic institutes, R&D laboratories and industries to enable them to carry out R&D work
  • To acquire and develop capability for preventive maintenance and repair of sophisticated instruments.
  • To organize short Term Courses / workshops on the use and application of various instruments and analytical techniques
  • To train technicians for maintenance and operation of sophisticated instruments
  • To undertake design and development of instruments / accessories of existing instruments

Sophisticated Analytical Instrument Facility (SAIF), Guwahati
(Sponsored by Dept. of Science & Technology, Govt. of India)

The Facilities available in SAIF Guwahati are

Automated Powder X-ray Diffractometer ( XRD )
Sequential X-ray Fluorescence Spectrometer ( XRF )
Single Crystal X-ray Diffractometer (SCD)
Sample Preparation Laboratory
Licensed Softwares

  • SuperQ (for XRF)
  • Pro Trace (for XRF)
  • JCPDS Database PDF1 and PDF2
  • ICSD software

Accessories

  • Pulveriser
  • Precision Electronic Balance
  • Pressed Pallet making facility
  • Fused Bead making facility
  • Muffle Furnace
  • Stereo zoom microscope
  • Standard Reference Material
    • Silicate Rocks
    • Cements
    • Limestone
  • 5 KVA Diesel Generator

1) X-ray Powder Diffractometer (XRD)

An Automated Powder X-ray Diffractometer ( XRD ) of Model APD 1700, Make Philips was installed in the year 1987 which after fifteen years of operation has become obsolete.

A fully Automated Computerised Powder X-ray Diffractometer ( XRD ) Model X’Pert Pro, Make PANalytical has been installed 2002 and is working.

The detailed specification are: Model : X’Pert Pro
Make : Philips ( Now PANalytical )
X-ray Tube : Cu
Angular Range ( 2θ ) : 1o to 167o
Programmable Divergence Slit
Programmable fixed slit with ¼ o, ½ o, 1o, 2o, 4o
High Temperature Attachment of range up to 1600o C
Thin Film Attachment
X’Pert software

  • Organiser
  • Data Collecter
  • Graphics & Identity
  • Stress and WinGIXA

ICDD database with PDF-1 & PDF2
ICSD Software

XRD analysis of solid samples are routinely done in SAIF Guwahati..

Solid sample in the form of dry powder of about 300 mesh about 3 gm or sample on glass slide of size 2cm X 3.5cm and thickness 0.2 cm with uniform sample layer of size 2cm X 1.5cm on one side is required. XRD with less amount of sample or of users specific sample is also possible in special cases.

The output consists of Diffractogram, Peak positions, d values & relative intensities, Integrated Intensities, Peak Area & FWHM. Other analysis capabilities/services are:

  • Phase Identification
  • Quantitative analysis of minerals present in the ICSD data base using X’Pert Plus software
  • Grazing incidence X-ray analysis of thin films
  • Partilce size measurement
  • Reflectivity measurement and film thickness analysis ( under development )
  • Microstrain and Stress analysis ( under development )
  • High Temperature ( upto 1600oC ) analysis of powder samples

2) X-ray Fluorescence Spectrometer (XRF)

SAIF Guwahati is equipped with XRF. It was installed in 2005. The detailed specifications are:
Computerised Sequential X-ray Fluorescence Spectrometer ( XRF )
Installed in 2005
Model : AXIOS
Make : PANalytical
X-ray Tube : Rh
Elemental Range : Oxygen to Uranium
Analysing Crystal : LiF200, LiF220, GE, PE,PX1
Detectors : Flow proportional counter & scintillation
Software : SuperQ Software for qualitative and quantitative analysis
Pro Trace Software for trace element analysis
Analysis Method : Pressed Pallet Method, Fused Bead Method
Standard Reference Material : Silicate Rocks, Cements, Limestone

Qualitative elemental analysis of solid samples, quantitative and trace element analysis of silicate rocks, cement, limestone samples are routinely done in the Qualitative elemental analysis of solid samples, quantitative and trace element analysis of silicate rocks, cement, limestone samples are routinely done in the XRF.

Sample in the form of dry powder about 200 mesh, about 10gm is required for estimation of major and minor element oxides and qualitative analysis. Qualitative analysis may be possible with less amount of sample in some cases and in case of non-powder the sample should be in suitable form. For analysis of traces 20gm sample is required.

  • Qualitative Analysis
  • Quantitative Analysis

Qualitative Analysis : Qualitative elemental analysis are done for detection of elements present in the sample.

  • Detectable elemental range is from oxygen to uranium
  • Lower limit of detection (LLD) varies from element to element
  • Lower Limit of Detection (LLD) also depends upon nature and compositional matrix of the sample

Quantitative Analysis : Quantitative analysis of following types of samples are done

  • Silicate Rocks
  • Cement
  • Limestone

Quantitative analysis of silicate rocks for 10 major element oxides SiO2, Al2O3, Fe2O3(T), MnO, MgO, Na2O, CaO, K2O, TiO2, P2O5 and 32 Trace Elements Ag, As, Ba, Br, Cd, Ce, Co, Cr, Cs, Cu, Ga, La, Mn, Nb, Nd, Ni, Mo, Pb, Rb, S, Sb, Sc, Sn, Sm, Sr, Th, Tl, U, V, Y, Zn, Zr are being done on routine basis.

XRF Lab of SAIF, Gauhati University is a regular Participant of GeoPT held two times in a year

International Proficiency Test for Analytical Geochemistry Laboratories (GeoPT)
conducted by
Dept. of Earth Sciences,
The Open University,
Walton Hall,Milton, Keynes,
Mk7 6AA,
United Kingdom

Since 2000, XRF Lab. of SAIF, Guwahati, Dept. of Instrumentation & USIC GU, is regularly participating in the International Proficiency Test for Analytical Geochemistry Laboratories ( GeoPT ) organized by International Association of Geoanalysis ( IAG ) two times in a year.

Now XRF Lab of SAIF, Guwahati is preparing for NABL accreditation.

3) Single Crystal X-ray Diffractometer (SCD)

SAIF Guwahati is equipped with X-ray Diffractometer (Single Crystal). This was added to our analysis service in 2010. It has provided analytical services to the Scientists of N E region of India. .

The detailed specifications are:

Instrument: X-ray Diffractometer (Single Crystal)
Make/ Model: 8820222800 BRUKER AXS SMART APEX II
Major Specifications/ Accessories available :
FULLY AUTOMATED CHARGED COUPLE DEVICE
CCD DETECTOR BASED SINGLE CRYSTAL XRD WITH LOW TEMPERATURE (77K) ATTACHMENT.
3-CIRCLE GONIOMETER.

Type of measurement/analysis by SCD :
Determination of :

  • Unit cell parameters
  • Crystal system
  • Space group
  • Molecular structure

Sophisticated Analytical Instrument Facility (SAIF), Guwahati
(Sponsored by Dept. of Science & Technology, Govt. of India)


Analysis Rates

Rates of Analysis for XRD ( in Rs ) [ Rate per sample ]

UserDiffractogramPhase Analysis Quantitative Analysis Particle Size Determination Lattice ParameteDetermination
Internal (GU) 150250 400 200 350
External 300 500 750 400 600
Industrial 990 1320 1650 1000 1400

Rates of Analysis for XRF (in Rs) [ Rate per sample ]

User Type10 Major & Minor Element OxidesLoss on Ignition(LOI)Each Trace Element
Non Academic & Industry 3,300210440
Academic ( GU) Teachers & Research Scholar1000100200
Students ( Up to 10 Samples)600100100
Academic (other) Teachers & Research1500200200
Students (Up to 10 Samples)1000200200

Rates of Qualitative XRF Analysis ( in Rs ) [ Rate per sample ]

Academic Internal ( GU ) : Rs. 500
Academic External : Rs. 700
Industrial User : Rs. 1,100

Rates of Pulverisation : Rs 50/- per sample

[12.36% SERVICE TAX EXTRA AS PER GOVT. DIRECTIVE]

Sophisticated Analytical Instrument Facility (SAIF), Guwahati
(Sponsored by Dept. of Science & Technology, Govt. of India)


XRD FORM

Sophisticated Analytical Instrument Facility (SAIF), Guwahati
(Sponsored by Dept. of Science & Technology, Govt. of India)


XRF FORM

Sophisticated Analytical Instrument Facility (SAIF), Guwahati
(Sponsored by Dept. of Science & Technology, Govt. of India)


GeoPT

Since 2000 SAIF Guwahati is regularly participating in the International Proficiency Test for Analytical Geochemistry Laboratories (GeoPT) organized by International Association of Geoanalysis ( IAG ) and till date 10 samples have been tested and reported so far by SAIF Guwahati.

Sophisticated Analytical Instrument Facility (SAIF), Guwahati
(Sponsored by Dept. of Science & Technology, Govt. of India)


Click on the following links-

XRD

XRF

Sophisticated Analytical Instrument Facility (SAIF), Guwahati
(Sponsored by Dept. of Science & Technology, Govt. of India)


Sample Analysis Capabilities

XRD

XRD analysis of solid samples are routinely done in SAIF Guwahati..

Solid sample in the form of dry powder of about 300 mesh about 3 gm or sample on glass slide of size 2cm X 3.5cm and thickness 0.2 cm with uniform sample layer of size 2cm X 1.5cm on one side is required. XRD with less amount of sample or of users specific sample is also possible in special cases.

The output consists of Diffractogram, Peak positions, d values & relative intensities, Integrated Intensities, Peak Area & FWHM. Other analysis capabilities/services are

  • Phase Identification
  • Quantitative analysis of minerals present in the ICSD data base using X’Pert Plus software
  • Grazing incidence X-ray analysis of thin films
  • Partilce size measurement
  • Reflectivity measurement and film thickness analysis ( under development )
  • Microstrain and Stress analysis ( under development )
  • High Temperature ( upto 1600oC ) analysis of powder samples

XRF

Qualitative elemental analysis of solid samples, quantitative and trace element analysis of silicate rocks, cement, limestone samples are routinely done in the XRF.

Sample in the form of dry powder about 200 mesh, about 10gm is required for estimation of major and minor element oxides and qualitative analysis. Qualitative analysis may be possible with less amount of sample in some cases and in case of non-powder the sample should be in suitable form. For analysis of traces 20gm sample is required.

  • Qualitative Analysis
  • Quantitative Analysis

Qualitative Analysis : Qualitative elemental analysis are done for detection of elements present in the sample.

  • Detectable elemental range is from oxygen to uranium
  • Lower limit of detection (LLD) varies from element to element
  • Lower Limit of Detection (LLD) also depends upon nature and compositional matrix of the sample

Quantitative Analysis : Quantitative analysis of following types of samples are done

  • Silicate Rocks
  • Cement
  • Limestone

Quantitative analysis of silicate rocks for 10 major element oxides SiO2, Al2O3, Fe2O3(T), MnO, MgO, Na2O, CaO, K2O, TiO2, P2O5 and 32 Trace Elements Ag, As, Ba, Br, Cd, Ce, Co, Cr, Cs, Cu, Ga, La, Mn, Nb, Nd, Ni, Mo, Pb, Rb, S, Sb, Sc, Sn, Sm, Sr, Th, Tl, U, V, Y, Zn, Zr are being done on routine basis.

XRD

Sophisticated Analytical Instrument Facility (SAIF), Guwahati
(Sponsored by Dept. of Science & Technology, Govt. of India)


XRD

An Automated Powder X-ray Diffractometer ( XRD ) of Model APD 1700, Make Philips was installed in the year 1987 which after fifteen years of operation has become obsolete.

A fully Automated Computerised Powder X-ray Diffractometer ( XRD ) Model X’Pert Pro, Make PANalytical has been installed 2002 and is working.

The detailed specification are-
Model : X’Pert Pro
Make : Philips ( Now PANalytical )
X-ray Tube : Cu
Angular Range ( 2? ) : 1o to 167o
Programmable Divergence Slit
Programmable fixed slit with ¼ o, ½ o, 1o, 2o, 4o
High Temperature Attachment of range up to 1600o C
Thin Film Attachment
X’Pert software

  • Organiser
  • Data Collecter
  • Graphics & Identity
  • Stress and WinGIXA

ICDD database with PDF-1 & PDF2
ICSD Software

XRF

Sophisticated Analytical Instrument Facility (SAIF), Guwahati
(Sponsored by Dept. of Science & Technology, Govt. of India)


XRF

SAIF Guwahati is equipped with two numbers of working XRFs. The first one was installed in 1992 and the second one was installed in 2005. The detailed specifications are

First XRF :

Computerised Sequential X-ray Fluorescence Spectrometer ( XRF )
Installation : 1992
Model : PW1480
Make : Philips
X-ray Tube : Rh, Cr – Au
Elemental Range : Fluorine to Uranium
Analysing Crystals : LiF200, LiF220, TLAP, PE, GE, PX1, PX2
Detectors : Flow Proportional Counter & Scintillation Counter
Software : Philips X40UU software, Online Alpha Software
Analysis Method : Pressed Pallet Method, Fused Bead Method
Standard Reference Material : Silicate Rocks, Cements, Limestone

Second XRF :

Computerised Sequential X-ray Fluorescence Spectrometer ( XRF )
Installed in 2005
Model : AXIOS
Make : Philips ( Now PANalytical )
X-ray Tube : Rh
Elemental Range : Oxygen to Uranium
Analysing Crystal : LiF200, LiF220, GE, PE,PX1
Detectors : Flow proportional counter & scintillation
Software : SuperQ Software for qualitative and quantitative analysis
Pro Trace Software for trace element analysis
Analysis Method : Pressed Pallet Method, Fused Bead Method
Standard Reference Material : Silicate Rocks, Cements, Limestone

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